Enhanced temperature compensation for resistive memory cell circuits

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United States of America Patent

PATENT NO 9865340
SERIAL NO

15366386

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Abstract

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A computer-implemented method for performing a voltage-based measurement of a resistive memory cell having a plurality of programmable cell states includes providing, via a processor, a prebiased voltage at a connecting node. The method further includes prebiasing a bitline capacitance of the resistive memory cell. In other aspects, the method includes settling, via the processor, a sensing circuit to a target voltage. The method further includes outputting a resultant value based on a sensed voltage at the resistive memory cell.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Papandreou, Nikolaos Thalwil, CH 143 1227
Pozidis, Charalampos Thalwil, CH 181 1383
Stanisavljevic, Milos Adliswil, CH 28 63

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