Mass analysis method and inductively coupled plasma mass spectrometer
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United States of America Patent
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Jan 9, 2018
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app pub date -
Mar 3, 2017
filing date -
Mar 4, 2016
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Abstract
An Inductively Coupled Plasma Mass Spectrometer including: a plasma ionization part; a mass analysis part; a storage part that stores ion information about mass-charge ratios and presence ratios of isotopic ions of all elements and mass-charge ratios and generation probabilities of compound ions and multivalent ions generated when the measuring object samples are plasma-ionized; a representative sample measuring part; and an element-containing inferring part that infers types of elements contained in the representative sample; an interference ion judgment part that, respective target elements in the inferred elements, judges according to ion information whether there are isotopes without interference ions; a determination part of measurement mass-charge ratio that determines the mass-charge ratio of the isotope without interference ions and a mass-charge ratio of an isotope whose a mass peak has the maximum intensity obtained by subtracting the intensity as a mass-charge ratio for measurement; and an all-sample measuring part.
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