Embedding resin composition for electron microscopey and method for observing sample with electron microscope using the same
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United States of America Patent
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Jan 16, 2018
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app pub date -
Sep 4, 2012
filing date -
Sep 6, 2011
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Abstract
The present invention provides an embedding resin composition for electron microscopy having satisfactory performance as an embedding medium, including embedding performance and sectioning quality, and exhibiting excellent antistatic performance; and a method for observing a sample with an electron microscope using the composition. The embedding resin composition for electron microscopy of the present invention having antistatic performance comprises an ionic liquid and an embedding medium comprising an epoxy-based resin, a methacrylate resin or an unsaturated polyester resin. Preferably, the ionic liquid comprising
- a quaternary ammonium compound based on the formula (I):
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