Method of and apparatus for correcting for intensity deviations in a spectrometer

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United States of America Patent

PATENT NO 9874515
APP PUB NO 20160123870A1
SERIAL NO

14895946

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Abstract

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A method of determining a pathlength deviation of a sample (610), the method comprising: exposing the sample (610) to electromagnetic radiation at a plurality of wavenumbers, determining electromagnetic absorption in the sample (610) at the plurality of wavenumbers, determining a first wavenumber associated with a first absorption level of an absorption band and a second wavenumber associated with a second absorption level of the absorption band, wherein the second wavenumber is different from the first wavenumber, determining a difference between the first wavenumber and the second wavenumber, and determining the pathlength deviation based on the difference.

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Patent Owner(s)

Patent OwnerAddress
FOSS ANALYTICAL A/SFOSS ALLE 1 HILLEROED DK-3400

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hansen, Per Waaben Kgs. Lyngby, DK 9 161

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