Multiple wavelengths real time phase shift interference microscopy

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United States of America Patent

PATENT NO 9880377
SERIAL NO

15260398

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Abstract

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A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.

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Patent Owner(s)

Patent OwnerAddress
PHOTONICSYS LTD9976100 WAHAT ALSALAM-NEVEH SHALOM

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abdulhalim, Ibrahim Wahat-Alsalam-Neve Shalom, IL 41 831
Ney, Michael Be'er Sheva, IL 8 19
Safrani, Avner D.N. Misgav, IL 21 52

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