Systems and methods for multiple species atom interferometry
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United States of America Patent
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Feb 20, 2018
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app pub date -
Oct 21, 2015
filing date -
Oct 31, 2014
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Abstract
An inertial measurement apparatus based on atom interferometry. In one example, the inertial measurement apparatus includes a vacuum chamber, first and second atom capture sites housed within the vacuum chamber, each of the first and second atom capture sites being selectively configured to trap and cool first and second atom samples of distinct atom species, an atom interferometry region disposed between the first and second atom capture sites, and first and second atom interferometers operating in the atom interferometry region, the first atom interferometer being configured to generate a first measurement corresponding to a common inertial input based on the first atom sample, and the second atom interferometer being configured to generate a second measurement corresponding to the same common inertial input based on the second atom sample.
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