Multiplexing with single sample metering event to increase throughput
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United States of America Patent
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Feb 27, 2018
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app pub date -
Jul 22, 2015
filing date -
Jul 23, 2014
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Abstract
An assay device includes a support, test elements arranged thereover, and a diverter defining a common sample addition area of the device. The diverter conducts respective portions of a fluidic sample from the area to each of the test elements. Another assay device includes the test elements, one a dry slide element, disposed over the support at least partly in proximity to each other to define a common sample addition area. Apparatus for analyzing a sample includes an assay device having the test elements, one a dry slide element. A controller operates a metering mechanism, to apply the sample to the assay device, an incubator, and a measurement device per a timing protocol to determine a characteristic of the sample. Methods for enabling an assay device to perform multiple tests based upon a single sample metering event include are also described.
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