Method and apparatus for auto-calibration of delay settings of memory interfaces
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United States of America Patent
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Mar 6, 2018
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app pub date -
Jan 24, 2017
filing date -
Jan 24, 2017
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Abstract
In some aspects, a calibration method includes performing a write/read test for each one of multiple combinations of write/read delay settings, wherein each one of the multiple combinations of write/read delay settings includes one of a plurality of write delay settings of a first delay device and one of a plurality of read delay settings of a second delay device. The method also includes obtaining test results for the write/read tests, determining a pass region based on the test results, determining a center of the pass region, and selecting one of the multiple combinations of write/read settings based on the center of the pass region.
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