Deterioration analysis method

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United States of America Patent

PATENT NO 9915627
SERIAL NO

15462403

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Abstract

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The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

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Patent Owner(s)

  • SUMITOMO RUBBER INDUSTRIES, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaneko, Fusae Kobe, JP 9 12
Kishimoto, Hiroyuki Kobe, JP 71 173

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