Semiconductor device and method of manufacturing the same

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United States of America Patent

PATENT NO 9917092
SERIAL NO

14980071

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of manufacturing a semiconductor device includes: forming an insulating film above a semiconductor substrate; forming a conductive film on the insulating film; forming a dielectric film on the conductive film; forming a plurality of upper electrodes at intervals on the dielectric film; forming a first protective insulating film on the upper electrodes and the dielectric film by a sputtering method; forming a second protective insulating film on the first protective insulating film by an atomic layer deposition method, thereby filling gaps of a grain boundary of the dielectric film with the second protective insulating film; and patterning the conductive film after the second protective insulating film is formed to provide a lower electrode.

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Patent Owner(s)

  • FUJITSU SEMICONDUCTOR LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ito, Hideki Aizuwakamatsu, JP 231 1751
Okita, Youichi Aizuwakamatsu, JP 3 4
Wang, Wensheng Kuwana, JP 107 683

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