Comparison device and method for comparing test pattern files of a wafer tester
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United States of America Patent
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Mar 20, 2018
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app pub date -
Nov 17, 2014
filing date -
Dec 20, 2010
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Abstract
A comparison device for comparing test pattern files of a wafer tester includes a storage unit and a processing unit. The comparison device stores a first to-be-compared file and a second to-be-compared file into the storage unit. The processing unit reads the first to-be-compared file and the second to-be-compared file from the storage unit to process and executes comparison operation, so as to generate a comparison result. The comparison operation compares the words in a first section of the first to-be-compared file with the words in a second section of the second to-be-compared file in a one-to-one manner, wherein, if the first section ending point is not the end of the first to-be-compared file or the second section ending point is not the end of the second to-be-compared file, the processing unit resets the first section and the second section, and executes comparison operation again.
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