System and method for testing frequency synthesizer
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United States of America Patent
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Mar 20, 2018
Grant Date -
Dec 31, 2015
app pub date -
Nov 11, 2013
filing date -
Feb 20, 2013
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Abstract
A method of testing a frequency synthesizer over a predetermined frequency range using a delay unit complying with a spectral delay distribution model modeling a spectral delay distribution of the delay unit over the predetermined frequency range. The method comprises generating at least one test signal with the frequency synthesizer according to at least one test command; passing the at least one test signal through the delay unit so as to obtain at least one delayed test signal; measuring at least one shift of a signal attribute between the delayed test signal and the test signal; estimating an accuracy of the frequency synthesizer by comparing the at least one measured shift with an expected shift, the expected shift being derived from the spectral delay distribution model of the delay unit and from the at least one test command.
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