Probe card having configurable structure for exchanging or swapping electronic components for impedance matching
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United States of America Patent
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Mar 27, 2018
Grant Date -
Apr 17, 2014
app pub date -
Dec 18, 2013
filing date -
Mar 11, 2010
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A probe card having a configurable structure for exchanging/swapping electronic components for impedance matching is provided. In the probe card, an applied force is exerted on the electronic component so as to make the electronic component electrically connected with at least one conductive contact pad of a supporting unit. The supporting unit is a circuit board or a space transformer. In order to facilitate the exchange or swap of the electronic component, the applied force can be removed. The probe card includes a pressing plate which can be moved between a pressing position and a non-pressing position. The pressing plate has a pressing surface which is contacted with the top end of the electronic component while the pressing plate is in the pressing position. Therefore, the applied force can be generated or removed by changing the positioning of the pressing plate.
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