Measurement probe and optical measurement system

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United States of America Patent

PATENT NO 9986891
APP PUB NO 20170082534A1
SERIAL NO

15266406

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A measurement probe includes: a plurality of optical fibers including an illumination fiber configured to propagate light to irradiate a measuring object and including a light receiving fiber configured to receive scattered light retuned from the measuring object; and a detection portion configured to detect contact with the measuring object, the detection portion having a contact part provided on a part of a side portion of the measurement probe, the side portion forming a surface along a longitudinal direction of the measurement probe, the contact part being configured to be in contact with measuring object.

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Patent Owner(s)

Patent OwnerAddress
OLYMPUS CORPORATION2951 ISHIKAWA-MACHI HACHIOJI-SHI TOKYO 192-8507

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Toriyama, Seiki Hino, JP 18 322

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