Using non-volatile memory bad blocks
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United States of America Patent
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Jun 12, 2018
Issued Date -
Nov 16, 2017
app pub date -
May 10, 2016
filing date -
May 10, 2016
priority date (Note) -
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status (Latency Note)
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Abstract
A system for using bad blocks in a memory system is proposed. The system includes accessing an identification of a plurality of bad blocks and corresponding error codes which, for example, were generated during a manufacturing test and stored on the memory integrated circuit. The system determines which blocks of the plurality of bad blocks to test for being still usable and which blocks of the plurality of bad blocks not to test for being still usable based on corresponding error codes. For each bad block that should be tested, a test from a plurality of tests is chosen based on the corresponding error code in order to determine if the bad block is still usable. Those blocks determined to be still usable are subsequently used to store non-mission critical information.
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