Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate
China Patent
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Abstract
A semiconductor wafer cleaning formulation, including l-35% wt. fluoride source, 20-60% wt. organic amines, 0.1-40%wt. nitrogenous component, e.g., a nitrogen-containing carboxylic acid or an imine, 20-50%wt. water, and 0-21% wt. metal chelating agents. The formulations are useful to remove residue from wafers following a resist plasma ashing step, such as inorganic residue from semiconductor wafers containing delicate copper interconnecting structures.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
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Patent Owner(s)
Patent Owner | Address |
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ADVANCED TECHNOLOGY MATERIALS INC | USDANBURY CT 06810-4169 |
International Classification(s)
- C09K:MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED ....
- H01L:SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICE....
- C23G:CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CH....
- C23F:NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM S....
- G03F:PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNE....
- C11D:DETERGENT COMPOSITIONS

- [Classification Symbol]
- [Patents Count]
Inventor(s)
Inventor Name | Address |
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WOJTCZAK WILLIAM A | - |
BERNHARD DAVID | - |
SEIJO MA FATIMA | - |
LONG ·RUAN | - |
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