SCANNING DEVICE FOR NONDESTRUCTIVE INSPECTION AND NONDESTRUCTIVE INSPECTION EQUIPMENT
European Patent Office Patent
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Abstract
A non-destructive inspection scanning apparatus and a non-destructive inspection apparatus which can cope with the size and shape of a structure, which is an inspection target, in which attachment to the structure is facilitated, and which can be reduced in size and cost are provided. A non-destructive inspection scanning apparatus (2) that relatively moves a sensor head (3) employed to detect a flaw in an inspection target (P) with respect to a test surface of the inspection target (P) includes a rod-shaped guide portion (27) that is disposed at the inspection target (P) and that extends along a surface of the inspection target (P); a pair of wheels (23) having a ring-like groove portion (23F), which sandwiches the guide portion (27) therein, at a circumferential surface that comes in contact with the inspection target (P); a suctioning portion (23) that generates a suction force that presses the wheels (23) against the inspection target (P); and a casing (21) that holds the sensor head (3) and to which the pair of wheels (23) are attached so as to be rotatable about a rotation axis that extends in a direction that intersects a surface of the inspection target (P) to which the wheels (23) come in contact.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
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Patent Owner(s)
| Patent Owner | Address |
|---|---|
| CENTRAL RES INST ELECT | JP |
International Classification(s)
Inventor(s)
| Inventor Name | Address |
|---|---|
| FUKUTOMI HIROYUKI | 〒2400196 神奈川県横須賀市長坂2-6-1 財団法人電力中央研究所 材料科学研究所内 KANAGAWA ?2400196 |
| LIN SHAN | TOKYO JAPAN TOKYO METROPOLIS |
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