Eddy current testing probe and eddy current testing apparatus
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United States of America Patent
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Jun 26, 2007
Grant Date -
Aug 3, 2006
app pub date -
Jan 6, 2006
filing date -
Jan 12, 2005
priority date (Note) -
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Abstract
An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.
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