On die termination circuit and method for calibrating the same

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United States of America Patent

PATENT NO 7782078
APP PUB NO 20080284467A1
SERIAL NO

12149775

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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On die termination circuit and method for calibrating the same includes a external resistor connected to a first node, a plurality of calibration resistors connected to a second node, the plurality of calibration resistors being turned on/off in response to a calibration code set, a current mirror configured to mirror currents of the first node and the second node and a code generator configured to generate a calibration code set according to the mirrored currents. In accordance with a method for calibrating an on die termination circuit of the present invention, the method includes a step of mirroring a current of a first node connected to an external resistor and a current of a second node connected to a plurality of calibration resistors and a step of generating a calibration code set according to the mirrored currents.

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Patent Owner(s)

  • HYNIX SEMICONDUCTOR INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koo, Cheul-Hee Kyoungki-do, KR 4 38

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