Method and apparatus for testing tunnel magnetoresistive effect element
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United States of America Patent
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Jun 26, 2007
Grant Date -
Oct 27, 2005
app pub date -
Apr 8, 2005
filing date -
Apr 23, 2004
priority date (Note) -
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Abstract
Testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element from a anti-substrate side to a substrate side for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element by comparing the first resistance value and the second resistance value with each other.
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