Integrated adjustable short-haul/long-haul time domain reflectometry

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6862546
APP PUB NO 20030163272A1
SERIAL NO

10080473

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Abstract

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A method and system for performing integrated adjustable short-haul/long-haul time domain reflectometry (TDR). A TDR pulse count is set to a predetermined number. Next, a TDR pulse is transmitted through a cable. The width of the TDR pulse is a function of the multiplication of the TDR pulse count with the period of a TDR clock. It is then determined whether the TDR pulse has been reflected back. If the TDR pulse has not been reflected, the TDR pulse count is successively increased to successively increase the width of the transmitted TDR pulse until a reflection is detected--indicating an open in the cable. Furthermore, it eliminates false detections of cable opens. Moreover, the system can be combined into a line interface unit (LIU) integrated circuit such that TDR functionality can be performed automatically without the use of a technician.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaburlasos, Nikos Sacramento, CA 115 494
Little, James Sacramento, CA 25 438
Nikhade, Vaishali Fair Oaks, CA 3 17

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