Wafer-level testing of optical and optoelectronic chips

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United States of America Patent

PATENT NO 7184626
SERIAL NO

10820631

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Abstract

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This application describes, among others, wafer designs, testing systems and techniques for wafer-level optical testing by coupling probe light from top of the wafer.

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Patent Owner(s)

  • LUXTERA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gunn, III Lawrence C Encinitas, CA 55 1463
Malendevich, Roman Oceanside, CA 9 184
Pinguet, Thierry J Cardif-By-The-Sea, CA 47 1270
Rattier, Maxime J Paris, FR 10 472
Sussman, Myles San Diego, CA 12 241
Witzens, Jeremy Pasadena, CA 35 988

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