Analog capacitor and method of manufacturing the same

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United States of America Patent

PATENT NO 7679124
SERIAL NO

11187489

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Abstract

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An analog capacitor capable of reducing the influence of an applied voltage on a capacitance and a method of manufacturing the analog capacitor are provided. The analog capacitor includes a lower electrode which is formed on a substrate, a multi-layered dielectric layer which includes at least one oxide layer and at least one oxynitride layer which are formed of a material selected from the group consisting of Hf, Al, Zr, La, Ba, Sr, Ti, Pb, Bi and a combination thereof and is formed on the lower electrode, and an upper electrode which is formed on the multi-layered dielectric layer.

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Patent Owner(s)

  • SAMSUNG ELECTRONICS CO., LTD.

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jeong, Yong-kuk Seoul, KR 45 635
Kim, Weon-hong Suwon-si, KR 64 1141
Kwon, Dae-jin Suwon-si, KR 41 882
Song, Min-woo Seongnam-si, KR 45 675
Won, Seok-jun Seoul, KR 117 2489

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