Wafer aligning apparatus and related method

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United States of America Patent

PATENT NO 7813542
SERIAL NO

11641870

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Embodiments of the invention provide a wafer aligning apparatus and a wafer aligning method. In one embodiment, the wafer aligning apparatus comprises an imaging unit adapted to take an image of a wafer being transferred from a load lock chamber to a transfer chamber and adapted to convert the image into digital signals, and a signal processing unit adapted to calculate a center alignment correction value for the wafer by comparing the digital signals to a master image stored in the signal processing unit. The wafer aligning apparatus further comprises a robot controller adapted to receive the center alignment correction value from the signal processing unit and adapted to control a transfer robot in accordance with the center alignment correction value to provide the wafer to a process chamber such that the center of the wafer is substantially aligned.

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Patent Owner(s)

  • SAMSUNG ELECTRONICS CO., LTD.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bae, Do-In Changwon-si, KR 13 243
Kim, Sang-Ho Yongin-si, KR 233 2982
Lee, Heok-Jae Suwon-si, KR 6 292
Park, Hyu-Rim Suwon-si, KR 3 22
Seo, Kee-Weone Suwon-si, KR 3 33
Woo, Chang-Woo Yongin-si, KR 5 49

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