Vibration noise mitigation in an interferometric system
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United States of America Patent
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Nov 30, 2004
Grant Date -
Sep 18, 2003
app pub date -
Mar 14, 2002
filing date -
Mar 14, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In the measurements of optical characteristics, such as measurements of group delay using an interferometric system, vibration noise can be at least partially offset by providing corrections on the basis of detecting light patterns that are indicative of the vibration noise. In each embodiment, light beams propagating through first and second paths are combined to form an interference signal, which is analyzed to provide the basis for the adjustments.
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