Method for evaluating insulating films
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United States of America Patent
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-
Feb 27, 1990
Issued Date -
N/A
app pub date -
Nov 7, 1988
filing date -
Oct 2, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test method is used for examining a sample insulating film to determine an expected value of time for the sample insulating film to undergo dielectric breakdown. A varying electric stress is applied to a sample insulating film to flow therethrough a varying electric current. The varying electric current is monitored until catastrophic dielectric breakdown occurs in the sample insulating film to measure a critical electric current which flows through the sample insulating film immediately before the breakdown occurs. The expected value of time to breakdown is determined according to the measured critical electric current.
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