In-situ monitor of process and device parameters in integrated circuits
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United States of America Patent
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Sep 22, 2009
Grant Date -
Aug 24, 2006
app pub date -
May 31, 2005
filing date -
Feb 22, 2005
priority date (Note) -
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status (Latency Note)
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Abstract
In accordance with the invention, a testing circuit formed on the integrated circuit is presented. A testing circuit according to the present invention is coupled to a scan path circuit and includes an input circuit coupled to a parameter testing circuit and an output driver coupled to the parameter testing circuit. Embodiments of the parameter testing circuit can include circuits for testing process, device, and circuit characteristics of the integrated circuit. Further, some embodiments of the testing circuit can be included in a scan path system where sequences of various testing circuits are included. Further, test parameters obtained from the parameter testing circuits can be utilized to adjust operating parameters of the integrated circuit.
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