Method for the parameterization of a sensor

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United States of America

PATENT NO 11262716
APP PUB NO 20190011890A1
SERIAL NO

16025481

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Abstract

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The invention relates to a method for the dynamic parameterization of at least one sensor in an industrial process in which

    measurement data of the process are acquired by means of a configuration sensor and of a productive sensor, with the configuration sensor and the productive sensor being sensors of the same kind;the measurement data are transmitted to a control unit;the control unit generates a parameter set for the productive sensor with reference to the measurement data and transmits the parameter set to the productive sensor; andthe productive sensor uses the parameter set in operation.

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Patent Owner(s)

Patent OwnerAddress
SICK AG79183 WALDKIRCH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schmidt, Fabian Teningen, DE 7 31

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