Method of producing microarray

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United States of America Patent

PATENT NO 7667194
APP PUB NO 20070084997A1
SERIAL NO

11566351

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of producing a microarray including: (A) ejecting a liquid sample from an outlet onto an inspection carrier to form inspection spots, inspecting the resultant inspection spots for their quality to determine whether the inspected spots are defective or successful, and detecting a defective discharge unit, if any; (B) making the detected defective discharge unit stop discharging the liquid sample to prevent formation of the defective sample spot; (C) forming successful sample spots on a carrier using successful discharge units to provide a successful microarray on which the successful spots are aligned in a predetermined pattern on the carrier; and (D) forming a successful spot to be formed originally on the successful microarray at the position of the defective spot where no spot is formed in step (B).

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Patent Owner(s)

  • NGK INSULATORS, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirota, Toshikazu Nagoya, JP 79 665
Noritake, Motoo Ichinomiya, JP 7 95
Ohnishi, Takao Nishikasugai-Gun, JP 86 674

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