Method for reducing interference and crosstalk in double optical tweezers using a single laser source, and apparatus using the same
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United States of America Patent
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May 19, 2015
Grant Date -
Jul 21, 2011
app pub date -
Jul 22, 2009
filing date -
Jul 22, 2008
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Abstract
Experimental studies of single molecule mechanics require high force sensitivity and low drift, which can be achieved with optical tweezers through an optical tweezers apparatus for force measurements. A CW infrared laser beam is split by polarization and focused by a high numerical aperture objective to create two traps. The same laser is used to form both traps and to measure the force by back focal plane interferometry. Although the two beams entering the microscope are designed to exhibit orthogonal polarization, interference and a significant parasitic force signal occur. Comparing the experimental results with a ray optics model, the interference patterns are caused by the rotation of polarization on microscope lens surfaces and slides. Two methods for reducing the crosstalk are directed to polarization rectification by passing through the microscope twice and frequency shifting of one of the split laser beams.
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