System and multipass probe for optical interference measurements
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United States of America Patent
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May 20, 2003
Grant Date -
N/A
app pub date -
Aug 9, 2000
filing date -
Aug 9, 2000
priority date (Note) -
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Abstract
An optical system includes a spectrometer and a multipass optical probe. The multipass optical probe includes a retroreflective element such that light propagating, in a first direction, from the probe to a sample under test and passing through or reflecting from the sample under test, is reflected back in a second direction opposite the first direction, so as to pass through the sample under test a total of at least two times.
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