Inspection, analysis, classification, and grading of transparent sheets using segmented datasets of photoelasticity measurements

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United States of America Patent

PATENT NO 11480532
SERIAL NO

16246513

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Abstract

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An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

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Patent Owner(s)

  • LITESENTRY LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hegstrom, Eric Tucson, US 6 51
Nelson, Bryan Burnsville, US 15 178

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