Tapered probe structures and fabrication
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United States of America Patent
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Sep 13, 2011
Grant Date -
May 21, 2009
app pub date -
May 10, 2006
filing date -
May 10, 2005
priority date (Note) -
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Abstract
Probe structures and fabrication techniques are described. The described probe structures can be used as probes for various applications such as conductance measurement probes, field emitter probes, nanofabrication probes, and magnetic bit writing or reading probes.
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