Multiple propagation wave parameter measuring method and apparatus and machine-readable recording medium recording multiple propagation wave parameter measuring program

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United States of America Patent

PATENT NO 6446025
SERIAL NO

09277684

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In a multiple propagation wave parameter measuring method, transmission waves are radiated into an outer space. The transmission waves are received as a multiple propagation wave. Arrival directions of the transmission waves are measured on the basis of reception signals. The transmission wave arriving from one direction of the measured arrival directions is defined as a desired wave, and the transmission waves arriving from remaining directions are defined as unnecessary waves. A weight with which a reception power ratio of the desired wave to the unnecessary waves becomes maximum is calculated. The reception signals are multiplied with the weight to extract the reception signal in which the unnecessary waves are suppressed. A change in delay time of the desired wave from a transmitting device to a receiving device is calculated on the basis of the reception signal in which the unnecessary waves are suppressed. A machine-readable recording medium storing a multiple propagation wave parameter measuring program is also disclosed.

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Patent Owner(s)

  • NEC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fukawa, Kazuhiko Tokyo, JP 21 700
Kuwahara, Yoshihiko Tokyo, JP 18 713
Matsumoto, Tadashi Tokyo, JP 131 1213
Nakamura, Yuki Tokyo, JP 250 1322

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