Position measuring arrangement

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7710578
APP PUB NO 20080062432A1
SERIAL NO

11900268

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A position measuring arrangement for detecting a relative position is disclosed. The position measuring arrangement includes a reflection scale graduation and a scanning unit having a plurality of optical elements. The plurality of optical elements includes a combining grating, a retro-reflector element, a scanning grating and detector elements. The optical elements are arranged so that light beams and/or partial light beams of a scanning beam path act on the reflection scale graduation at least twice; a directional reversal of the incident partial light beams impinging on the reflection scale graduation perpendicularly with respect to the measuring direction takes place by the retro-reflector element; and a pair of partial light beams impinges in a non-parallel manner on the combining grating, and the combining grating brings the partial light beams impinging on the combining grating to interference, so that phase-shifted signals are detected by the plurality of detector elements.

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Patent Owner(s)

  • DR. JOHANNES HEIDENHAIN GMBH

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Holzapfel, Wolfgang Obing, DE 124 1103
Sändig, Karsten Palling, DE 6 22

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