Systems and methods for removing microfeature workpiece surface defects

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United States of America Patent

PATENT NO 7264539
APP PUB NO 20070015446A1
SERIAL NO

11181341

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Systems and methods for removing microfeature workpiece surface defects are disclosed. A method for processing a microfeature workpiece in accordance with one embodiment includes removing surface defects from a surface of a microfeature workpiece by engaging the surface with a buffing medium having a first hardness, and moving at least one of the workpiece and the buffing medium relative to the other. After removing the surface defects and before adding additional material to the microfeature workpiece the method can further include engaging the microfeature workpiece with a polishing pad having a second hardness greater than the first hardness. Additional material can be removed from the microfeature workpiece by moving at least one of the microfeature workpiece and the polishing pad relative to the other.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bastian, Joseph A Boise, ID 2 1
Reukauf, Jeremey T Emmit, ID 2 1

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