X-ray imaging system and method
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United States of America Patent
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Aug 17, 2010
Grant Date -
Jan 1, 2009
app pub date -
Jun 24, 2008
filing date -
Jun 26, 2007
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Abstract
The present invention provides an X-ray imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and also capable of observing a sample with high sensitivity even if the intensity of an incident X-ray varies with time. A refraction angle of X-ray beams caused by the sample is detected at a time by X-ray imagers by utilizing multiple X-ray diffractions by multiple analyzer crystals.
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