System for placement optimization of chip design for transient noise control and related methods thereof

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United States of America Patent

PATENT NO 11436401
APP PUB NO 20200151380A1
SERIAL NO

16571773

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Abstract

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Transient voltage noise, including resistive and reactive noise, causes timing errors at runtime. A heuristic framework, Walking Pads, is introduced to minimize transient voltage violations by optimizing power supply pad placement. It is shown that the steady-state optimal design point differs from the transient optimum, and further noise reduction can be achieved with transient optimization. The methodology significantly reduces voltage violations by balancing the average transient voltage noise of the four branches at each pad site. When pad placement is optimized using a representative stressmark, voltage violations are reduced 46-80% across 11 Parsec benchmarks with respect to the results from IR-drop-optimized pad placement. It is shown that the allocation of on-chip decoupling capacitance significantly influences the optimal locations of pads.

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Patent OwnerAddress
UNIVERSITY OF VIRGINIA PATENT FOUNDATION722 PRESTON AVENUE SUITE 107 CHARLOTTESVILLE VA 22903

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Skadron, Kevin Charlottesville, US 22 135
Stan, Mircea R Charlottesville, US 12 239
Wang, Ke Charlottesville, US 368 2843
Zhang, Runjie Charlottesville, US 3 10

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