Self-aligned split-gate NAND flash memory and fabrication process

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United States of America Patent

PATENT NO 6885586
SERIAL NO

10251664

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Abstract

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Self-aligned split-gate NAND flash memory cell array and method of fabrication in which a series of self-aligned split cells are formed between a bit line diffusion and a common source diffusion. Each cell has control and floating gates which are stacked and self-aligned with each other, and a third gate which is split from but self-aligned with the other two. In some disclosed embodiments, the split gates are utilized as erase gates, and in others they are utilized as select gates. The memory cells are substantially smaller than prior art cells, and the array is biased so that all of the memory cells in it can be erased simultaneously, while programming is bit selectable.

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Patent Owner(s)

  • SILICON STORAGE TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chiou-Feng Hsinchu, TW 21 846
Fan, Der-Tsyr Hsinchu, TW 33 631
Lu, Jung-Chang Hsinchu, TW 13 186
Tuntasood, Prateep Santa Clara, CA 27 810

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