Laser lithography system with improved bandwidth control

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United States of America Patent

PATENT NO 7899095
APP PUB NO 20080253413A1
SERIAL NO

12082301

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and apparatus may comprise a seed laser, along with an amplifier laser amplifying the output of the seed laser. A bandwidth metrology module may provide a bandwidth measurement and a bandwidth error signal may be provided using a bandwidth set point. A differential timing system responsive to the error signal can selectively adjust a differential firing time between the seed laser and amplifier laser. A beam dimension and center wavelength control system may adjust a beam dimension, within the cavity of the seed laser, to select bandwidth, and may adjust center wavelength at the same time, using a plurality of beam expansion prisms and at least one other prism or other optical element in the cavity to select center wavelength.

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Patent Owner(s)

  • CYMER, LLC

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Partlo, William N Poway, US 183 6732

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