Transmission electron microscope specimen and method of manufacturing the same

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United States of America Patent

PATENT NO 7297950
APP PUB NO 20060097168A1
SERIAL NO

11241953

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Abstract

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A transmission electron microscope (TEM) specimen and a method of manufacturing the specimen are provided. The specimen comprises an analysis point. The specimen is formed by forming a dimple at a surface portion of the preliminary specimen, and ion milling the preliminary specimen having the dimple.

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Patent Owner(s)

  • SAMSUNG ELECTRONICS CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Jung-Sun Suwon-si, KR 3 8
Lee, Myoung-Rack Suwon-si, KR 2 4

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