Impedance-scanning quartz crystal microbalance

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United States of America Patent

PATENT NO 8583396
APP PUB NO 20110022353A1
SERIAL NO

12741871

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Abstract

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Method for detecting a change in mass with a quartz crystal impedance-scanning microbalance, which can be connected to an evaluation device, wherein the quartz crystal microbalance is designed to transmit the measurement points recorded at a predetermined data recording rate as raw data to the evaluation device, including at least the following steps: linearly fitting the measurement points of the raw data to a fractional rational function and determining at least one resonance frequency from the fitted measurement points of the raw data, wherein a change in the at least one resonance frequency corresponds to an effective change in mass.

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Patent Owner(s)

  • C3 PROZESS- UND ANALYSENTECHNICK GMBH;C3 PROZESS-UND ANALYSENTECHNIK GMBH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gores, Heiner Jacob Regenstauf, DE 1 3
Multerer, Michael Kronach, DE 1 3
Schmeer, Georg Pentling/Grossberg, DE 1 3
Wudy, Franz Warminster, DE 1 3

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