Method of using SNR to reduce factory test time
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United States of America Patent
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Jun 2, 2009
Grant Date -
Aug 31, 2006
app pub date -
Feb 25, 2005
filing date -
Feb 25, 2005
priority date (Note) -
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Abstract
The application relates to wireless networks and more particularly to a method of reducing factory test time of receiver sensitivity in a Code Division Multiple Access (CDMA) wireless device. Under TIA/EIA/-98E, the radio frequency (RF) sensitivity of a CDMA wireless receiver is the minimum received power, measured at the mobile station antenna connector, at which the frame error rate (FER) does not exceed 0.5% with 95% confidence. In order to reduce the test time of FER test method, the relation between correlated energy (or Ec/Io) and FER is determined using simulated traffic and the correlated energy (or Ec/Io) measurement is then used as the test parameter on like models to achieve the same or superior test confidence with significantly reduced test time.
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