Device and method for testing a resistance value of on-die-termination device and semiconductor device having the same
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United States of America Patent
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Feb 15, 2011
Grant Date -
Oct 29, 2009
app pub date -
Dec 31, 2008
filing date -
Apr 25, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device and a method for testing a resistance value of an on-die-termination (ODT) device and a semiconductor device having the same are presented. The device can include a comparator, a storage unit and and an output unit. When in an ODT test operation mode, the comparator compares a reference voltage against an input data input to a pad to determine the resistance value of the ODT device and outputs a determination data on the resistance value of the ODT device corresponding to the determination results. The storage unit stores the output of the comparator in synchronization with a clock signal. When in the ODT test operation mode, the output unit outputs the determination data on the resistance value of the ODT device stored in the storage unit to the pad. Thereby not only is the device configured to determine whether or not a defect of the resistance value of the ODT device exists but the device and the method are able to achieve this task in a substantially shorter testing time period.
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