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United States of America Patent

PATENT NO 7774666
APP PUB NO 20080086666A1
SERIAL NO

11866595

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The analyzer according to the present invention is an analyzer having a scan test function, and including scan paths each having flip-flops which function as a shift register when a scan test is performed, and a switching unit operable to switch between a first connection state, and a second connection state where the scan paths are connected in series to each other and further an output from the last stage of the scan path is connected to the input of the first stage of the scan path.

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Patent Owner(s)

  • SOCIONEXT INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iseda, Yasunaga Osaka, JP 2 13
Kawamura, Makoto Osaka, JP 118 2249
Ochi, Yutaka Osaka, JP 18 175
Yamaguchi, Hiroshi Nara, JP 604 7494

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