Dynamic overdrive compensation test system and method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 31, 2006
Grant Date -
Jun 2, 2005
app pub date -
Dec 2, 2003
filing date -
Dec 2, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention(s) relates to a wafer test system including a circuit to communicate an overdrive to a chuck, the chuck moving a wafer towards a probe head responsive to the overdrive, a circuit to measure a contact resistance of at least one channel in each of a plurality of dies associated with the wafer using the probe head, a circuit to compute a per channel standard deviation responsive to measuring the contact resistance, a circuit to compare the standard deviation on the at least one channel to a threshold, and a circuit to increase the overdrive responsive to the comparison.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully