Semiconductor device and method for manufacturing the same

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United States of America Patent

PATENT NO 7851874
APP PUB NO 20080054380A1
SERIAL NO

11847930

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Abstract

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A semiconductor device according to an embodiment includes device isolating layers having a top surface lower than a sheet height of a semiconductor substrate; a gate insulating layer and a gate electrode sequentially stacked on the upper surface of an active region of the semiconductor substrate between the device isolating layers; a spacer formed at the side wall of the gate electrode; a source/drain region formed in the semiconductor substrate between the spacer and the device isolating layers; and a silicide film formed on the source/drain region.

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Patent Owner(s)

  • DB HITEK CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bang, Ki Wan Cheongju-si, KR 6 12

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