Semiconductor device

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United States of America Patent

PATENT NO 9041007
SERIAL NO

13299882

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Abstract

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A MOSFET cell of a semiconductor device includes a polysilicon gate electrode and an n+-source region formed in an upper portion of an n-drift layer. An interlayer insulating film covers the gate electrode. An Al source electrode extends on the interlayer insulating film. An Al gate pad is connected to the gate electrode. A barrier metal layer that prevents diffusion of aluminum is interposed between the source electrode and the interlayer insulating film, and between the gate pad and the gate electrode.

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Patent Owner(s)

  • MITSUBISHI ELECTRIC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Oritsuki, Yasunori Tokyo, JP 7 68
Suekawa, Eisuke Tokyo, JP 16 183
Tarui, Yoichiro Tokyo, JP 45 395

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