Optical wavefront analyzer and method using a single wave shifter

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United States of America Patent

PATENT NO 6115126
SERIAL NO

09235874

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Abstract

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An optical wavefront analyzer based on the phase-shearing interferometry technique for measuring a wavefront of a light beam is disclosed. The analyzer includes a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. A method of measuring a wavefront of a light beam is also provided for solving the problems of two-axial focusing and phase inconsistency encountered the prior art by employing phase-shearing and phase-shifting techniques to improve the method of optical wavefront mesurement. A non-iterative, path-independent unwrapping methodology is used to deal with a complicated wavefront.

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Patent Owner(s)

  • NATIONAL SCIENCE COUNCIL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Heui-Yung Taipei, TW 1 4
Chen, Ching-Wei Taipei, TW 66 809
Chen, Wei-Liang Taoyuan Hsein, TW 19 98
Chen, Yi-Chun Keelung, TW 153 877
Hsieh, Chi-Tang Taipei Hsein, TW 114 520
Lee, Chih-Kung Taipei, TW 89 1078
Lee, Chung-Min Taipei, TW 2 4
Lee, Shu-Sheng Taipei, TW 13 89
Lin, Shih-Tsong Taipei, TW 1 4
Yeh, Gym-Bin Taipei, TW 1 4

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