Measurement of internal wire delay
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United States of America Patent
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Jan 31, 2023
Grant Date -
Nov 18, 2021
app pub date -
May 14, 2020
filing date -
May 14, 2020
priority date (Note) -
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status (Latency Note)
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Abstract
Semiconductor devices that include test circuitry to measure internal signal wire propagation delays during memory access operations, and circuity configured to store delay information that is used to configure internal delays based on the measured internal signal propagation circuit delays. The semiconductor device includes a test circuit configured to measure a signal propagation delay between a command decoder and a bank logic circuit based on time between receipt of a test command signal directly from the command decoder and a time of receipt of the test command signal routed through the bank logic circuit.
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